表面结构与散射图案
测量什么?
一种是测量纳米结构表面(GISAXS)或其原子尺度结构(GIWAXS)的长程有序参数。
2D散射数据表明了有序结构的存在,而1D数据图表给出了关于结构特征取向或尺寸的信息

图1.在硅基底上的P3HT:PCBM薄膜上获得的掠入射广角X射线散射数据。通过XSACT软件对原始数据进行转换,以说明面内和面外的散射图案。
样品
此测试的主要样品是聚合物以及具有以下特征的无机材料:
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纳米结构表面
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纳米结构或多孔薄膜
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层状纳米材料(堆叠)
GISAXS/GIWAXS在高分子科学中的应用示例:
- Müller‐Buschbaum, P. “The Active Layer Morphology of Organic Solar Cells Probed with Grazing Incidence Scattering Techniques”. Advanced Materials, 26, 7692–7709 (2014).
- Sung, S.J., et al. “ Enhanced gas barrier property of stacking-controlled reduced graphene oxide films for encapsulation of polymer solar cells “. Carbon, vol 150, pp. 275-283 (2019).
- Guliyeva, A. et al. ” Transition Pathway between Gyroid and Cylindrical Morphology in Linear Triblock Terpolymer Thin Films “. Macromolecules, 52, 17, 6641–6648 (2019).
无机薄膜的GISAXS数据分析示例:
- Hohn, N. et al. “Amphiphilic diblock copolymer-mediated structure control in nanoporous germanium-based thin films.” Nanoscale, 11, 2048–2055 (2019).
- Reid, B. et al. “Photocatalytic Template Removal by Non-Ozone-Generating UV Irradiation for the Fabrication of Well-Defined Mesoporous Inorganic Coatings.” ACS Appl. Mater. Interfaces 11, 19308–19314 (2019).